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JENOPTIK AG
 
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April 2007 Finetech 2007

For the third time now, JENOPTIK Surface Inspection GmbH presented their technology at the Finetech 2007, the leading international trade fair for the display industry. The fair was a huge success and we thank the international audience for many interesting conversations and for many new contacts.

 

 

March 2007 ICE 2007

A live demonstration of IQLine, the latest state-of-the-art surface inspection system of JENOPTIK Surface Inspection GmbH, was presented to the international audience of the ICE 2007 in Munich. The attendance of our booth exceeded our expectations by far and we’d hereby like to thank all visitors of our booth for stopping by.

 

 

October 2006 Glasstec 2006

The leading international trade show of the glass industry was the appropriate platform for the presentation of our new system generation IQLine. We are pleased about the great number of interesting expert talks and leads and we'd like to thank the many existing customers of us who chose to visit our booth.

 

 

October 2006 IQLine - The New System Generation

The global markets experience a continuous development and an increasing demand for yet more precise, faster and powerful systems for the quality control of production processes.

Our new surface inspection system IQLine with its flexible architecture is the answer to this challenge. A versatile base platform with optional hardware and software components forms a scaleable quality assurance device with CCD or laser technology that is perfectly adaptable to the respective application.

 

 

June 2006 Jenoptik Surface Inspection GmbH takes part in the FPD Taiwan 

From June 14th to June 16th 2006, Jenoptik Surface Inspection GmbH exhibited SIRIS-G at a taiwanese fair for the first time. A lot of international visitors frequented the booth and kept our staff busy.

 

June 2006 First ICE UK in Coventry  - Jenoptik Surface Inspection GmbH  was among the exhibitors

Having been successful in Munich for several years, the well-known converting exhibition ICE took place in the UK for the first time. From June 13th to June 14th numerous visitors took the opportunity to visit our booth and to talk directly to our web inspection experts.

 

June 2006 Jenoptik Surface Inspection GmbH exhibits at the SID Show 2006 and presents SIRIS-G

From June 4th-9th, we presented our inspection system SIRIS-G at the SID 2006 in San Francisco, California.
In cooperation with their american partner, Darkfield Technologies, Jenoptik Surface Inspection GmbH presented SIRIS-G, the modular surface inspection system based on laser scanning technology. We were pleased to welcome such a lot of visitors from around the world and to have many new contacts.

 

April 2006 Jenoptik Surface Inspection GmbH presents the surface inspection system SIRIS-G at the Finetech 2006 

From April 19th until April 21st Jenoptik Surface Inspection GmbH showed their surface inspection system SIRIS-G at the Finetech 2006. The feedback of the international visitors was very encouraging and resulted in a variety of expert discussions and contacts.

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