| April 2007 |
Finetech 2007
For the third time now, JENOPTIK Surface Inspection GmbH
presented their technology at the Finetech 2007, the leading
international trade fair for the display industry. The fair was a
huge success and we thank the international audience for many
interesting conversations and for many new contacts.
|
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| March 2007 |
ICE 2007
A live demonstration of IQLine, the latest state-of-the-art surface
inspection system of JENOPTIK Surface Inspection GmbH, was presented to
the international audience of the ICE 2007 in Munich. The attendance of
our booth exceeded our expectations by far and we’d hereby like to thank
all visitors of our booth for stopping by.
|
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| October 2006 |
Glasstec 2006
The leading international trade show of the glass
industry was the appropriate platform for the
presentation of our new system generation IQLine. We
are pleased about the great number of interesting expert
talks and leads and we'd like to thank the many existing
customers of us who chose to visit our booth.
|
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| October 2006 |
IQLine - The New System
Generation
The global markets experience a continuous
development and an increasing demand for yet more
precise, faster and powerful systems for the quality
control of production processes.
Our new surface inspection system IQLine with its
flexible architecture is the answer to this challenge. A
versatile base platform with optional hardware and
software components forms a scaleable quality assurance
device with CCD or laser technology that is perfectly
adaptable to the respective application.
|
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| June 2006 |
Jenoptik Surface
Inspection GmbH takes part in the FPD
Taiwan
From June 14th to June 16th 2006, Jenoptik Surface
Inspection GmbH exhibited SIRIS-G at a taiwanese fair
for the first time. A lot of international visitors
frequented the booth and kept our staff busy.
|
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| June 2006 |
First ICE UK in
Coventry - Jenoptik Surface
Inspection GmbH was among the exhibitors
Having been successful in Munich for several years,
the well-known converting exhibition ICE took place in
the UK for the first time. From June 13th to June 14th
numerous visitors took the opportunity to visit our booth
and to talk directly to our web inspection experts.
|
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| June 2006 |
Jenoptik Surface
Inspection GmbH exhibits at the SID Show 2006 and presents SIRIS-G
From June 4th-9th, we presented our inspection
system SIRIS-G at the SID 2006 in San Francisco,
California. In cooperation
with their american partner, Darkfield Technologies,
Jenoptik Surface
Inspection GmbH presented SIRIS-G, the modular surface inspection system
based on laser scanning technology. We were pleased to
welcome such a lot of visitors from around the world and
to have many new contacts.
|
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| April 2006 |
Jenoptik Surface
Inspection GmbH presents the surface inspection system
SIRIS-G at the Finetech 2006
From April 19th until April 21st Jenoptik
Surface Inspection GmbH showed their surface inspection
system SIRIS-G at the Finetech 2006. The feedback of the
international visitors was very encouraging and resulted
in a variety of expert discussions and contacts.
|
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